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Map of SER changes along the control silicon wafer (top) and SER change along the control silicon wafer (bottom). |
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| Part of: Drobyshevsky YV, Anfimov IM, Varlachev VA, Kobeleva SP, Nekrasov SA, Stolbov SN (2020) Experimental confirmation of a new method for selective neutron separation. Nuclear Energy and Technology 6(4): 235-241. https://doi.org/10.3897/nucet.6.60294 |