Profile of changes in the resistivity of silicon: 1 – the trace of neutron fluxes from the external selection plates with Ksel = 10; 2 – the trace of neutron fluxes from the internal selection plates with Ksel = 15. The vertical dashed lines with the arrows indicate the directions of the thermal neutron flux from the four graphite selection plates.

 
 
  Part of: Drobyshevsky YV, Anfimov IM, Varlachev VA, Kobeleva SP, Nekrasov SA, Stolbov SN (2020) Experimental confirmation of a new method for selective neutron separation. Nuclear Energy and Technology 6(4): 235-241. https://doi.org/10.3897/nucet.6.60294